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Optical tomography of non-crystalline films by interference enhanced Raman spectroscopy

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dc.contributor.author Gerasimov, V.
dc.contributor.author Герасимов, Віталій Вікторович
dc.contributor.author Mitsa, V.
dc.contributor.author Міца, В.
dc.contributor.author Babinets, Yu.
dc.contributor.author Бабинець, Ю.
dc.date.accessioned 2020-06-17T10:13:05Z
dc.date.available 2020-06-17T10:13:05Z
dc.date.issued 1996
dc.identifier.uri http://dspace.msu.edu.ua:8080/jspui/handle/123456789/6788
dc.description Gerasimov V. Optical tomography of non-crystalline films by interference enhanced Raman spectroscopy / V. Gerasimov, V. Mitsa, Yu. Babinets // Fresenius J Anal Chem. - V. -355. -1996. - P.404–405 en_US
dc.description.abstract The depth dependence of Raman spectra of a-GeS2 -type films having a different optical thickness (k/4 and k/2) and their refractive index profile have been investigated. The model of a layered-inhomogeneous structure of films has been proposed. There have been distinguished three regions: near-surface region (up to 50 As), central part and transition film-substrate region (up to 300 As). en_US
dc.language.iso en en_US
dc.publisher УжНУ en_US
dc.subject spectroscopy en_US
dc.subject refractive index en_US
dc.subject Raman spectrum en_US
dc.subject Raman spectroscopy en_US
dc.subject optical tomography en_US
dc.subject спектроскопія en_US
dc.subject показник заломлення en_US
dc.subject Раманівський спектр en_US
dc.subject Раманівська спектроскопія en_US
dc.subject оптична томографія en_US
dc.title Optical tomography of non-crystalline films by interference enhanced Raman spectroscopy en_US
dc.type Article en_US


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