Optical tomography of non-crystalline films by interference enhanced Raman spectroscopy

Gerasimov, V.; Герасимов, Віталій Вікторович; Mitsa, V.; Міца, В.; Babinets, Yu.; Бабинець, Ю.

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dc.contributor.author	Gerasimov, V.
dc.contributor.author	Герасимов, Віталій Вікторович
dc.contributor.author	Mitsa, V.
dc.contributor.author	Міца, В.
dc.contributor.author	Babinets, Yu.
dc.contributor.author	Бабинець, Ю.
dc.date.accessioned	2020-06-17T10:13:05Z
dc.date.available	2020-06-17T10:13:05Z
dc.date.issued	1996
dc.identifier.uri	http://dspace.msu.edu.ua:8080/jspui/handle/123456789/6788
dc.description	Gerasimov V. Optical tomography of non-crystalline films by interference enhanced Raman spectroscopy / V. Gerasimov, V. Mitsa, Yu. Babinets // Fresenius J Anal Chem. - V. -355. -1996. - P.404–405	en_US
dc.description.abstract	The depth dependence of Raman spectra of a-GeS2 -type films having a different optical thickness (k/4 and k/2) and their refractive index profile have been investigated. The model of a layered-inhomogeneous structure of films has been proposed. There have been distinguished three regions: near-surface region (up to 50 As), central part and transition film-substrate region (up to 300 As).	en_US
dc.language.iso	en	en_US
dc.publisher	УжНУ	en_US
dc.subject	spectroscopy	en_US
dc.subject	refractive index	en_US
dc.subject	Raman spectrum	en_US
dc.subject	Raman spectroscopy	en_US
dc.subject	optical tomography	en_US
dc.subject	спектроскопія	en_US
dc.subject	показник заломлення	en_US
dc.subject	Раманівський спектр	en_US
dc.subject	Раманівська спектроскопія	en_US
dc.subject	оптична томографія	en_US
dc.title	Optical tomography of non-crystalline films by interference enhanced Raman spectroscopy	en_US
dc.type	Article	en_US