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dc.contributor.authorGerasimov, V.-
dc.contributor.authorГерасимов, Віталій Вікторович-
dc.contributor.authorMitsa, V.-
dc.contributor.authorМіца, В.-
dc.contributor.authorBabinets, Yu.-
dc.contributor.authorБабинець, Ю.-
dc.date.accessioned2020-06-17T10:13:05Z-
dc.date.available2020-06-17T10:13:05Z-
dc.date.issued1996-
dc.identifier.urihttp://dspace.msu.edu.ua:8080/jspui/handle/123456789/6788-
dc.descriptionGerasimov V. Optical tomography of non-crystalline films by interference enhanced Raman spectroscopy / V. Gerasimov, V. Mitsa, Yu. Babinets // Fresenius J Anal Chem. - V. -355. -1996. - P.404–405en_US
dc.description.abstractThe depth dependence of Raman spectra of a-GeS2 -type films having a different optical thickness (k/4 and k/2) and their refractive index profile have been investigated. The model of a layered-inhomogeneous structure of films has been proposed. There have been distinguished three regions: near-surface region (up to 50 As), central part and transition film-substrate region (up to 300 As).en_US
dc.language.isoenen_US
dc.publisherУжНУen_US
dc.subjectspectroscopyen_US
dc.subjectrefractive indexen_US
dc.subjectRaman spectrumen_US
dc.subjectRaman spectroscopyen_US
dc.subjectoptical tomographyen_US
dc.subjectспектроскопіяen_US
dc.subjectпоказник заломленняen_US
dc.subjectРаманівський спектрen_US
dc.subjectРаманівська спектроскопіяen_US
dc.subjectоптична томографіяen_US
dc.titleOptical tomography of non-crystalline films by interference enhanced Raman spectroscopyen_US
dc.typeArticleen_US
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