Optical tomography of non-crystalline films by interference enhanced Raman spectroscopy

Please use this identifier to cite or link to this item: http://dspace.msu.edu.ua:8080/jspui/handle/123456789/6788

Title:	Optical tomography of non-crystalline films by interference enhanced Raman spectroscopy
Authors:	Gerasimov, V. Герасимов, Віталій Вікторович Mitsa, V. Міца, В. Babinets, Yu. Бабинець, Ю.
Keywords:	spectroscopy refractive index Raman spectrum Raman spectroscopy optical tomography спектроскопія показник заломлення Раманівський спектр Раманівська спектроскопія оптична томографія
Issue Date:	1996
Publisher:	УжНУ
Abstract:	The depth dependence of Raman spectra of a-GeS2 -type films having a different optical thickness (k/4 and k/2) and their refractive index profile have been investigated. The model of a layered-inhomogeneous structure of films has been proposed. There have been distinguished three regions: near-surface region (up to 50 As), central part and transition film-substrate region (up to 300 As).
Description:	Gerasimov V. Optical tomography of non-crystalline films by interference enhanced Raman spectroscopy / V. Gerasimov, V. Mitsa, Yu. Babinets // Fresenius J Anal Chem. - V. -355. -1996. - P.404–405
URI:	http://dspace.msu.edu.ua:8080/jspui/handle/123456789/6788
Appears in Collections:	Статті

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